This reference covers the three major methods for the characterization of nanomaterials. It explains the basic principles of a given characterization technique and then elaborates on how measurements are performed, problems that may arise, how one can avoid specific problems, how to get optimal sample preparations, how to choose measurement conditions properly, etc. Readers receive detailed guidance on sample preparation, choice of instruments, instrumental setups, measurement conditions, data evaluation, data interpretation, and how to avoid common mistakes.